The world's premier designer and manufacturer of ultra high performance probe cards and probing solutions for the semiconductor industry. Probe cards and probing solutions for modeling & characterization, parametric test, and wafer level reliability that thrive in any temperature extremes:
- Ultra High Performance ceramic based crash resistant probe cards and multi contact probes. Probing solutions support -65 C to 400 C applications from FA level measurements using AttoFast(™), low capacitance characterization and WLR.
- Production parametric probe cards for in line testers and analytical applications.
- High performance parametric cable assemblies to support low leakage, low noise measurements and probe card interfaces