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  275 Lake Ave      
  Sunapee, NH 03782      
  Phone: 603.493.2619
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  Lab and manufacturing products for testing photonic integrated circuits and optical components for insertion loss, return loss or polarization dependent loss measurements across the full wavelength range with unprecedented dynamic range, speed and resolution. Products include mainframe, high power continuously tunable lasers, optical switches, optical power meters, combiner modules, variable attenuators, detector modules and electrical bit error rate sampling oscilloscopes.      

  iTEST Specializes in the design of aerospace grade power supplies, measuring instruments for research applications, and reliability test benches for BiLT (burn-in and life-test) of active or passive electronic components. Modular 19” 4U high chassis model power supply systems are robust and reliable and designed according to the customer’s needs with Current down to nA and Voltages to 1500V with USB and Ethernet communication and Windows,Linux, or NI Labview control. Calibrations in accordance to the ISO/CEI 17025 standard      

  Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50 Ohm; X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters. SOLT and TRL VNA calibration kits for all Agilent, Rohde Schwarz and Anritsu VNAs, calibration standards, metrology, precision and instrument coaxial adapters, waveguide adapters, coaxial to waveguide adapters, connector gage kits, cable assemblies, and torque wrenches. Many products in stock on the Maury web store.      

  Submicron Thermal Imaging systems based on the Thermoreflectance principal with ultrafast transient response for Characterization profiling, Time-Dependant Thermal Analysis, Flip Chip Thermal Analysis, Hot Spot Detection & Failure Analysis      

  Millibox is a compact and economical mmWave radiation pattern test chamber for 18-95 GHz applications. It has a modular design: 80-200cm far-field chamber with available 2-axis 360 degree gimbal with open-source SW controller. Perfect solution for 5G, 60 GHz 802.11ad/802.11ay, 77 GHz automotive radar and misc. mmWave applications.    

  Wafer probe stations from 25mm-300mm, manual systems, semi-auto, fully automated 25 wafer loading systems, RF, high power, low current,THz systems, SiPh wafer test systems, PCB probers, RF probes, multi-contact probes, thermal chucks, microscopes and micropositioners.      

  Semi and fully automatic probe stations for Sensing, Optical Communications, Micro-Display, LED and uLED testing at wafer level, tape and die level, AOI systems, wafer mappping and sorting systems, pick and place, test handler, tape and reel. Complete systems available with SMU, pulser, source, meter and MUX combination series.      

  Osensa Innovations manufactures phosphor based ultra low noise, high resolution fiber optic temperature measurement systems operating over a -110C to 750C temperature range with 0.1 °C accuracy at 0.01 °C resolution. Applications include MRI, NMR, Laser Ablation Focused Ultrasound, Induction Heating, High Voltage and measuring temperature of electronic components in high power RF applications. The probes are completely immune to MRI / RF fields and high voltage with no offsets or calibration required. The systems feature digital and analog output and synchronized temperature measurements with USB and Ethernet communication.      
  RCL Microwave specializes in broadband material characterization and can measure from 1-110 GHz. Testing includes liquids, powders, paints, epoxies, circuit board materials, plastics, magnetic, and virtually any other material. We perform expert material anaysis using state of the art instruments, specialty techniques and custom designed fixtures resulting in superior, reliable results.      

  Signal Microwave designs and builds RF/microwave end launch and vertical launch connectors and test boards to 110 GHz using military grade materials and processes. Many products can be found in stock at competitive prices.    

  Packaged Semiconductor Device Probe pins for BGA/LGA,QFN,QFP. High power (15A), kelvin (0.3mm) and high frequency (>110 GHz), Production and Manual Test Sockets (to 15,000 pins, 256 Gbps), WLCSP probe heads (0.4-0.15mm pitch, up to 16 sites, 0.1mm single site). Pin selectable for low C-res and low cross talk applications      
  Power dividers/combiners to 16 way, high power passives to 2kW, directional couplers to 20 GHz, hybrids, pick-off tees, rack mount assemblies.